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apo lwd nir, 40×  (Nikon)


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    Nikon apo lwd nir, 40×
    Apo Lwd Nir, 40×, supplied by Nikon, used in various techniques. Bioz Stars score: 99/100, based on 57094 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/apo lwd nir, 40×/product/Nikon
    Average 99 stars, based on 57094 article reviews
    apo lwd nir, 40× - by Bioz Stars, 2026-05
    99/100 stars

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    (a) Measured <t>NIR</t> intensities of a TiO 2 sample at different temperatures (red markers) used for temperature calibration. A least-square algorithm is used to fit the Sakumi-Hattori function (blue, solid line). The dark red data point also belongs to TiO 2 , but is not used for calibration, as the intensity is close to the lower detection limit. Measured intensities at different temperatures of the Si 3 N 4 ceramic heater are also shown (black markers). The temperature limits for calibration are marked as gray lines. The blue dashed line is at 70% of the full well capacity, where non-linear behavior of the detector may occure. (b) NIR (false color) image of an illuminated microscope scale. The ruler has a length of 1 mm and the distance of the bars provide a resolution of 10 μm. The colorbar indicates the measured NIR intensity (c) The intensity profile of the reflected NIR radiation. As inset is shown a magnified region of the ruler. The IFOV of 1.34 μm per pixel of the imaging system, determined by the magnification ( m = <t>5x)</t> of the microscope optics and the pixel pitch, fit accurately with the scale and the 10 μm increments are resolved.
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    (a) Measured <t>NIR</t> intensities of a TiO 2 sample at different temperatures (red markers) used for temperature calibration. A least-square algorithm is used to fit the Sakumi-Hattori function (blue, solid line). The dark red data point also belongs to TiO 2 , but is not used for calibration, as the intensity is close to the lower detection limit. Measured intensities at different temperatures of the Si 3 N 4 ceramic heater are also shown (black markers). The temperature limits for calibration are marked as gray lines. The blue dashed line is at 70% of the full well capacity, where non-linear behavior of the detector may occure. (b) NIR (false color) image of an illuminated microscope scale. The ruler has a length of 1 mm and the distance of the bars provide a resolution of 10 μm. The colorbar indicates the measured NIR intensity (c) The intensity profile of the reflected NIR radiation. As inset is shown a magnified region of the ruler. The IFOV of 1.34 μm per pixel of the imaging system, determined by the magnification ( m = <t>5x)</t> of the microscope optics and the pixel pitch, fit accurately with the scale and the 10 μm increments are resolved.
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    Image Search Results


    (a) Measured NIR intensities of a TiO 2 sample at different temperatures (red markers) used for temperature calibration. A least-square algorithm is used to fit the Sakumi-Hattori function (blue, solid line). The dark red data point also belongs to TiO 2 , but is not used for calibration, as the intensity is close to the lower detection limit. Measured intensities at different temperatures of the Si 3 N 4 ceramic heater are also shown (black markers). The temperature limits for calibration are marked as gray lines. The blue dashed line is at 70% of the full well capacity, where non-linear behavior of the detector may occure. (b) NIR (false color) image of an illuminated microscope scale. The ruler has a length of 1 mm and the distance of the bars provide a resolution of 10 μm. The colorbar indicates the measured NIR intensity (c) The intensity profile of the reflected NIR radiation. As inset is shown a magnified region of the ruler. The IFOV of 1.34 μm per pixel of the imaging system, determined by the magnification ( m = 5x) of the microscope optics and the pixel pitch, fit accurately with the scale and the 10 μm increments are resolved.

    Journal: Scientific Reports

    Article Title: Operando high speed near infrared imaging during laser sintering of nanoparticles for time and space resolved temperature measurements

    doi: 10.1038/s41598-026-37445-7

    Figure Lengend Snippet: (a) Measured NIR intensities of a TiO 2 sample at different temperatures (red markers) used for temperature calibration. A least-square algorithm is used to fit the Sakumi-Hattori function (blue, solid line). The dark red data point also belongs to TiO 2 , but is not used for calibration, as the intensity is close to the lower detection limit. Measured intensities at different temperatures of the Si 3 N 4 ceramic heater are also shown (black markers). The temperature limits for calibration are marked as gray lines. The blue dashed line is at 70% of the full well capacity, where non-linear behavior of the detector may occure. (b) NIR (false color) image of an illuminated microscope scale. The ruler has a length of 1 mm and the distance of the bars provide a resolution of 10 μm. The colorbar indicates the measured NIR intensity (c) The intensity profile of the reflected NIR radiation. As inset is shown a magnified region of the ruler. The IFOV of 1.34 μm per pixel of the imaging system, determined by the magnification ( m = 5x) of the microscope optics and the pixel pitch, fit accurately with the scale and the 10 μm increments are resolved.

    Article Snippet: The camera is equipped with a NIR optimized infinity corrected objective (Plan Apo NIR 5x, Mitutoyo) with a magnification of 5 (Fig. a).

    Techniques: Microscopy, Imaging